Precision Interferometric Measurements In Non-ideal Environments
Precision optical components are essential for modern optics/photonics systems. Modern electronics, computers, and software have made it possible to greatly improve the fabrication and testing of optical components and optical systems and the resulting improvements in the new optical instruments and devices we use are evident. Once the data obtained testing an optical system is in the computer it is possible to do sophisticated computer analysis to determine what is wrong with the optical system and what needs to be done to correct the system, and how well the system will perform if it is not improved. It is now practical to test optical systems much better than the reference optics used in the optical test setup. Until recently, a major limitation of interferometry for precision metrology was the sensitivity to the environment. In recent years many techniques for performing high quality interferometric measurements in non-ideal environments have been developed and new techniques are being introduced all the time. This talk discusses some of the different techniques for reducing the effects of vibration and atmospheric turbulence on interferometric measurements. The application of these techniques for the measurement of surface vibration, the testing of optical components including large astronomical optics, and the measurement of deformations of diffuse structures will be described.
James Wyant, College of Optical Sciences at the University of Arizona
James C. Wyant is an emeritus professor at the College of Optical Sciences at the University of Arizona, where he was Director (1999-2005) and Dean (2005-2012). He received a B.S. in physics from Case Western Reserve University and M.S. and Ph.D. in optics from the University of Rochester. He was a founder of the WYKO Corporation and served as its president and board chairman from 1984 to 1997 and he was a founder of the 4D Technology Corporation and currently serves as its board chairman. Wyant is a member of the National Academy of Engineering, a Fellow of OSA (Optical Society of America), SPIE (International Society of Optics and Photonics), and the Optical Society of India, an honorary member of the Optical Society of Korea, and former editor-in-chief of the OSA journal Applied Optics. He was the 2010 president of OSA and the 1986 president of SPIE.
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